Simultaneously cleans electron microscopy specimens and holders
The Fischione Model 1070 NanoClean automatically and quickly removes organic contamination (hydrocarbon) for microscopy applications. It is multifunctional; it simultaneously cleans electron microscopy specimens, specimen holders, and stubs. It is also ideal for surface science techniques.
The NanoClean features an easy-to-use touchscreen embedded module that allows the user to control individual instrument functions, such as delivered power, chamber pressure, gas mixture, and process time. For dedicated cleaning of electron microscopy specimens and holders, the NanoClean includes a recipe that yields optimal plasma processing conditions. Other recipes are available for applications, such as enhancing the hydrophilic properties of biological support grids.
Enhanced imaging and analysis
Cleaning is solely by reactive gas compounds formed by the plasma chemically reacting with carbonaceous material on the specimen and specimen holder. A low-energy, inductively coupled, high-frequency, downstream plasma effectively cleans the specimen surface without changing its elemental composition or structural characteristics.
In electron microscopes with high brightness electron sources, specimens that are not plasma treated tend to contaminate. The NanoClean ensures confidence that carbonaceous contamination will not interfere with imaging or analysis, even during fine probe microanalysis for extended periods. Highly contaminated specimens can be cleaned in two minutes or less.
Features
The vacuum system for the NanoClean is oil free. The chamber includes a load lock for rapid specimen exchange making the NanoClean ideal for high throughput applications. The NanoClean contains three mass flow controllers and is designed to accept multiple gases. Typically, the time-proven gas mixture of 25% oxygen and 75% argon is connected to one of the gas inlets. The NanoClean is fitted with two additional gas inlets that accept gas supplies that can be blended using the NanoClean's internal mass flow technology. An automatic matching network ensures that the high-frequency power is effectively coupled to the plasma and the delivered power is suited for the application. The matching network regulates plasma power for a variety of conditions, objects to be processed, or gases employed.
Standard and specialised specimen holders
The NanoClean readily accepts one or two side-entry specimen holders for all commercial transmission, scanning transmission, and scanning electron microscopes. An additional port allows large, bulk objects to be placed in the chamber for processing. This is ideal for scanning electron microscopy or surface science applications. A specialized specimen holder port allows the cleaning of specimens contained on carbon grids.
Model 1070 NanoClean Specifications |
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Plasma system |
High frequency (13.56 MHz) power amplifier inductively coupled to a quartz and stainless steel plasma chamber |
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Ion energies less than 12 eV as a function of the downstream plasma |
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Automatic matching network |
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Compatible with TEM specimen holders for transmission electron microscopes manufactured by: |
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• FEI Company/Philips Electron Optics |
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• Hitachi High Technologies America Inc. |
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• JEOL Ltd. |
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• Carl Zeiss Microscopy |
Vacuum system |
Oil-free turbomolecular drag pump and a multistage diaphragm pump |
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Vacuum load lock |
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Ultimate vacuum of 1 x 10-6 mbar |
Chamber |
Accepts two specimen holder ports |
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Chamber lid provides access for bulk objects up to 3.5 in (8.9 cm) diam |
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Viewport for chamber observation |
Gas |
Three gas inputs |
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Nominal 10 psi (200 kPa) delivery pressure |
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Flow rate is controlled by the embedded module |
User interface |
Programming through a touch screen embedded module |
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Dedicated recipes for electron microscopy specimen and grid processing |
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Ability to customize parameters |
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Process timer for automatic termination |
Dimensions |
27 in (69 cm) width x 22 in (56 cm) height x 23 in (59 cm) depth |
Weight |
160 lb (73 kg) |
Power requirements |
100/120/220/240 V AC, single phase, 660 W |
Warranty |
One years |
Fischione Model 1070 datasheet
Fischione Model 1070 specifications
Application note: Plasma cleaning of carbon films for transmission electron microscopy
Applications of plasma cleaning for electron microscopy of semiconducting materials
Controlling protein adsorption on graphene for cryo-EM using low energy hydrogen plasmas
Fischione plasma cleaners comparison
Improving automation for cryo-EM specimen preparation
Plasma cleaning and its applications for electron microscopy
Plasma cleaning of carbonaceous samples using a shield
Preventive maintenance program: ion mills and plasma cleaners
How the NanoClean stacks up to its competitors
Morphological evolution of GP zones and nanometer-sized precipitates in the AA2050 aluminium alloy
Application note: Preparing hydrophilic, carbon-supported grids for cryo electron microscopy
Multifunctional graphene supports for electron cryomicroscopy
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