Anne Fallon

Lambda Photometrics are delighted to announce an exciting new partnership to promote Xiton Photonics GmbH products in the UK & Ireland. For more than 10 years Xiton Photonics GmbH has been producing high-quality, DPSS lasers with a core expertise in nonlinear optical conversion that has enabled Xiton to develop lasers with deep ultraviolet (UV) wavelengths of 224, 213 & 193nm...

The new industrial cameras of the Baumer EX series focus on essential standard-compliant basic functions and therefore are ideal for varied typical machine vision applications. Integrating the latest generation of CMOS sensors in their robust metal housing, they provide long-term stability in application designs. With resolutions from VGA up to 2 megapixel and up to 217 frames per second, the...

A frequency response analyser is a piece of test equipment designed to inject a sinewave into a circuit, and measure the frequency response of the circuit at multiple test points in order to generate a gain and phase response. This application provides Frequency Response Analysis (FRA) capabilities for the PicoScope instruments from Pico Technology. The FRA uses a common technique...

Metricon’s prism coupling instruments have been referenced in numerous scientific journal articles spanning a wide range of disciplines. This list of Journal References on the prism coupling technique is divided into the following categories: An initial short section entitled "Basic Theory of Prism Coupling" lists representative articles on the theory of thin film waveguides and the prism coupling technique. To...

Metricon’s Model 2010/M offers important advantages over ellipsometry for many applications - unmatched refractive index accuracy, dramatically simpler operation and data analysis, and greater tolerance of poor sample quality. Although prism couplers and ellipsometers can both be used to measure the index of bulk materials and to simultaneously measure film thickness and refractive index, there are major differences in the...

The Metricon Model 2010/M prism coupler offers unmatched ease and accuracy in measuring: Refractive index/birefringence of bulk materials Refractive index and thickness of thin films Loss of optical waveguides Compared to instruments based on optical interference, ellipsometry, or Abbe refractometry, the Metricon 2010/M’s prism coupling technology provides unmatched index accuracy/resolution, and minimal sample preparation is required. The system also measures...

The Model 2010/M can be used to measure thickness and index for one or both films of a dual film structure (as many as four film parameters) provided the top film has a higher refractive index than the lower film. Dual film measurements on transparent substrates or underlying (third layer) films are even possible in many cases. Detailed specifications for...

The accuracy of the Model 2010/M’s refractive index measurement makes possible monitoring of the concentration of phosphorus (and potentially other dopants) in PSG and BPSG films with a combination of speed, simplicity, and sensitivity unmatched by other techniques. The phosphorus monitoring application is based on the fact that as phosphorus concentration in SiO2 increases, refractive index also increases. For the...

The conventional way to measure index of contact or intraocular lenses is using an Abbe refractometer where the lens is not immersed in liquid. Advantages of using the Metricon Model 2010/M for measuring such lenses include: Maintains full hydration during measurement: A cell is available to allow the lens to be measured while it is completely immersed in hydrating fluid...

Option 2010-TC allows determination of temperature coefficient of refractive index by measuring index for thin films and bulk materials at temperatures as high as 200˚ C. Temperature coefficient data can also be used to calculate thermal expansion coefficients (Kang et al, Appl. Phys Lett. 81, 1438 (2002)). In the prism coupling technique, measurement of index at elevated temperature is complicated...