Knowledge Base

Zygo Corporation announced the introduction of the ZeGage™ Plus optical profiler, a full-featured instrument for the 3D measurement of surface topography and roughness. The system provides the same ease of use, vibration robustness and small footprint as the ZeGage profiler but with a higher level of precision, faster measurement speed, and an increased range of measurable surfaces and features. "The ZeGage™ Plus is...

Pioneering the Optical Measurement segment with the unique UV-VIS-MWIR PHOTON RT spectrophotometer, EssentOptics continues to work closely with its customers worldwide and add new features improving product performance, measurement results and day-to-day work satisfaction. The upgraded PHOTON RT was showcased at the Laser World of Photonics 2015 exhibition in Munich, Germany (June 22-25, 2015). Throughout extensive field tests with our...

The new version of PhotonSoft program features advanced capability to conduct group measurements of single and multiple substrates. Such function is of great value when determination of optimum angle of incidence for maximum optical performance is required. Example 1: Thin film polariser The thin film polarisers are often used to separate polarisation of incoming beam, e.g. laser beam. For appropriate...

Whilst working alongside machine vision system integrators, supporting end users and specifying systems for industrial applications the first question asked is ‘Do you really need a colour image?’ Why? Storing and handling data is a challenge and often a fight when working with inspection systems that need to run 24/7. If you can work in mono than we strongly encourage...

During the last few years diode lasers have replaced the Helium-Neon laser in many mass applications (e.g., barcode scanner, marking, adjusting, aligning). The global reduction in Helium-Neon laser sales means a great challenge for the few remaining manufacturers. Whereas, on the one hand, niche products require a resourceful mind to ensure the continuity of raw material supplies, on the other...

  The new version of PhotonSoft program features advanced capability to conduct group measurements of single and multiple substrates. Such function is of great value when determination of optimum angle of incidence for maximum optical performance is required. Measurement of a polariser using a sequence of 5 consecutive measurements of transmittance and reflectance. All of them are shown within one...

Optical profilers are interference microscopes, and are used to measure height variations – such as surface roughness – on surfaces with great precision using the wavelength of light as the ruler. Optical interference profiling is a well-established method of obtaining accurate surface measurements. Optical profiling uses the wave properties of light to compare the optical path difference between a test surface and a reference surface...

ZYGO's Verifire™ Series of laser Fizeau interferometers represent a complete line of high performance metrology instruments for the measurement of plano, spherical and aspherical surfaces and material characteristics. The systems provide a variety of proprietary acquisition techniques to ensure optimum metrology in a wide range of environments. For acquisition in turbulent environments, ZYGO offers the DynaFiz interferometer. While all Verifire™ models can...

Researchers at Imperial College and Rolls-Royce have investigated the nature of blue corrosion areas in Ti alloys used in aerospace applications. After extensive investigation using Light Optical Microscopy (LOM) and Secondary Electron Imaging (SEI) they were able to identify the same blue area with both techniques. The LOM shows the area well but gives no surface topography, whereas because the...

Lock-in amplifiers are used to detect and measure very small AC signals, all the way down to a few nanovolts. Accurate measurements may be made even when the small signal is obscured by noise sources many thousands of times larger. Lock-in amplifiers use a technique known as phase-sensitive detection to single out the component of the signal at a specific...