EPMA Solutions at Lambda Photometrics

Electron Probe Microanalysis (EPMA) is a powerful analytical technique used to determine the elemental composition of solid materials with exceptional spatial resolution and quantitative accuracy.

Using a focused electron beam, EPMA enables precise measurement of both major and trace elements across microscopic features, making it an essential tool in materials science, geology, semiconductor research, and advanced manufacturing. Achieving reliable EPMA results, however, depends heavily on effective sample preparation and contamination control.
At Lambda Photometrics, we support EPMA workflows with a range of advanced preparation and inspection solutions designed to maximise accuracy, efficiency, and reproducibility. Our portfolio addresses every critical stage of the process - from producing flat, damage-free surfaces and maintaining contamination-free conditions to verifying sample readiness before analysis.

Fischione Model 1061 SEM Mill
A high-precision ion milling and polishing system designed to produce EPMA-ready surfaces with minimal preparation time. Its compact design and controlled milling capabilities ensure flat, damage-free planar and cross-section samples, supporting accurate and reliable EPMA results.

Fischione Model 1062 Trion Mill
A fully automated tabletop argon ion mill optimised for preparing large, uniform specimen areas critical for EPMA mapping and quantitative analysis. With flexible parameter control and three ion sources, it produces exceptionally flat, deformation-free surfaces on samples up to 50 mm in diameter—ideal for consistent, high-quality EPMA measurements across wide areas.

Fischione Model 1070 Plasma Cleaner
An essential pre-analysis tool for EPMA workflows, the Model 1070
removes hydrocarbon contamination that can compromise probe stability and analytical accuracy. Its low-energy plasma cleaning preserves
surface chemistry and structure while ensuring contamination-free
conditions for high-precision EPMA, particularly during fine-probe or trace element analysis.

Semplor Nanos Tabletop SEM
A rapid screening tool that enables users to inspect surface quality, homogeneity, and preparation artifacts before EPMA analysis. By verifying sample readiness in advance, it helps reduce probe time, improve data reliability, and ensure optimal analytical conditions.

Together, these solutions provide a complete EPMA workflow, supporting users from sample preparation through to final measurement. The result is greater confidence in analytical data, improved reproducibility, and consistently high-quality results.

Lambda Photometrics is the leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Instrumentation, Laser & Light based products, Optics, Electro-optic Testing, Spectroscopy, Machine Vision, Optical Metrology, Fibre Optics, Microscopy and Anti-vibration tables & custom solutions.