Probe Tips or Probe Needles come in a variety of materials, lengths, shapes and tip diameter or radii (Everbeing are stated in tip diameter). They provide direct electrical contact to the circuit under test. Probe tips are specified to suit each individual application. Considerations should be made regarding the material to be probed, temperature, bond pad size and bond pad...
Knowledge Base
Welcome to the Lambda Knowledge Base
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How Zygo delivers high-performance optics from an unmatched range of substrates
To make sure high-performance optical systems don’t crack under pressure, selecting the right material is not a secondary consideration, it is foundational. The substrate used for an optical window or mirror governs the system’s optical performance, thermal stability, and resilience under operational conditions. Zygo™, a global leader in precision optics, distinguishes itself through a material-agnostic capability, manufacturing from an exceptionally... -
OSA: Optical Amplifier (EDFA) Measurement Guide
Outline of Optical amplifier measurementWith the increase in communication traffic, the importance of optical amplifiers such as EDFAs (erbium-doped fiber amplifiers) that can directly amplify optical signals without converting them into electrical signals has been widely deployed in traditional backbone optical transmission networks. This proven amplification technique has expanded to a next generation application to boost free space communication laser... -
Three Ways to Measure Pulsed Light with an Optical Spectrum Analyser
Overview of Pulsed Light Measurement Why use pulsed light? A semiconductor laser emits light by a driving current. This drive current causes the semiconductor laser chip to generate heat, causing a shift in the output wavelength and potentially damaging the laser. To avoid such problems, pulse-driven light emission is widely used. Furthermore, high-power industrial lasers may require an energy accumulation... -
OSA: SMSR Measurement of High-Power O-band Lasers for Optical Transceivers
Optical transceivers are one of the indispensable key devices for optical communications that interconvert optical and electrical signals. There are various types of optical transceivers: SFP, QSFP, 200GbE, 400GbE, and other network standards. In recent years, optical transceivers have become increasingly high-power to extend communication distance. To accomplish this, the laser in an optical transceiver must have a longer cavity length to achieve high power capability, which causes side mode wavelengths close to the main signal. This increases the need for high resolution/high dynamic range in SMSR (Side Mode Suppression Ratio) measurements. The AQ6380, which offers high resolution and wide dynamic range, is the perfect solution for SMSR measurements of O-band lasers for 400GbE QSFP-DD optical transceivers. Reasons why engineers choose the AQ6380 monochromator OSA: 5 pm... -
Zygo Unveils Industry’s Widest FOV Interferometric Objective — The 0.5X ZWF
Zygo, a global leader in precision metrology and optical solutions, has announced the launch and availability of its groundbreaking 0.5X ZWF (Zygo Wide Field) Objective— the widest field-of-view (FOV) interferometric objective commercially available. Engineered for high-speed, high-precision measurement applications, the 0.5X ZWF Objective is set to redefine efficiency and accuracy in industries such as semiconductor, precision machining, and photonics. Invented... -
Oscilloscope Technical FAQ: Oscilloscopes Key Features
Oscilloscopes are essential tools for engineers, technicians, and researchers working with electronic signals. Choosing the right oscilloscope and understanding its technical specifications can significantly impact measurement accuracy and efficiency. This FAQ addresses some of the most important aspects of oscilloscope performance and application. General QuestionsWhat is an oscilloscope?An oscilloscope is an electronic test instrument used for observing the precise shape... -
STT-MRAM device - Preparing specimens for imaging and analysis
Plan view TEM specimens from a fully fabricated spin-transfer torque magnetic random-access memory (STT-MRAM) device were prepared using a Ga FIB system. Post-FIB concentrated Ar ion beam milling using the Model 1080 PicoMill® TEM specimen preparation system of these plan view TEM specimens allowed controlled thinning and produced artifact-free TEM specimens. FIB plan view specimen preparation followed by concentrated Ar... -
Shock Deformation Studies
Shear band and dynamic recovery of hexagonal close-packed materials.Mg corrodes very quickly when in contact with water, therefore it requires special precautions during mechanical and electrolytic polishing. Mg is also a very soft, which makes it difficult to obtain a deformation-free surface using standard sample preparation techniques. An alternative technique is to use broad ion beam milling, such as Fischione Instruments’ Model... -
LAS™ Lens Alignment Technology - The Basics
The Optical Alignment Lens Alignment Station (LAS™) employs a focused laser beam in reflection to measure the surface decenter and tilt. Following reflection from the lens surface, the laser beam is focused to a bright spot on the LAS™ camera at two distinct vertical locations - Normal (or Cat’s Eye) and Confocal. The Normal signal occurs when the focused laser reflects directly from the...



