YIC Technologies NFP Kit-Near Field Probe Solution

Y.I.C. Technologies, developer of EMC/EMI (electromagnetic compatibility/electromagnetic interference) test & measurement solutions is introducing a low cost, affordable EMC/EMI troubleshooting solution. The NFPKit is developed to assist design engineers to rapidly diagnose & solve EMC/EMI challenges.

The EMC certification process is costly & time consuming and with this low-cost pre-compliance solution, it will give businesses the opportunity to minimise risk at this critical stage.

“The EMC testing market is growing, and we are proud to offer an easy, accurate and reliable solution to address the needs of the small and mid-size companies. It is great to be part of this exciting release,” says Yoram Shimoni.

NFP Kit designed by Y.I.C. Technologies is designed for measuring near field emissions for EMC/EMI troubleshooting and Pre-Compliance testing.

These probes is used to locate, identify, measure, and characterise potential sources of electromagnetic radiation. Interference radiated from traces or components of electronic PCBs, assemblies, cables, enclosures, or products can also be located. The probe output is proportional to the magnetic field (H) strength present at the probe location.

Product Features:

• Fully integrated with Y.I.C. Technologies EMViewer software and EMProbe
• Normalization and correction when using the EMViewer software
• Flat response within the range of operation
• Slim Design and Protective Coating
• 18GHz Measured Cable included