OptoTest is proud to announce the latest advancement in MPO/MTP® testing, the OP940-CSW. This compact insertion loss (IL) and return loss (RL) test system features the industry-leading speed and accuracy of the switched OP940 in a new form factor that improves the test process. The OP940-CSW is an internally switched IL and RL meter, available in both 12- and 24...
Lambda News
Lambda is a leading supplier of characterisation, measurement and analysis equipment, applied to signals from DC to Light. Our company provides hardware, software and integrated solutions throughout the UK & Ireland.
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SAVE 15% on all High Performance Reference Cables from OptoTest
SAVE 15% on all High Performance Reference Cables from OptoTest. For a limited time, stock up on this essential element of your test setup at a discounted rate – including 24-fiber fanout cables and non-BIMMF cables. https://www.lambdaphoto.co.uk/high-performance-reference-mtp-mpo-cables.html https://www.lambdaphoto.co.uk/optotest-hpr-performance-reference-cables.html To speak with a Sales & Applications Engineer please call 01582 764334 or click here to email. Lambda Photometrics is a leading UK Distributor of Characterisation, Measurement and... -
LAMBDA AWARDED ISO 9001:2015
We are pleased to announce that following our recent assessment by SAI Global Certification Services Pty Ltd, we have been awarded ISO 9001:2015 registration. Click HERE to download ISO Certificate Lambda Photometrics is a leading UK Distributor of Characterisation, Measurement and Analysis solutions with particular expertise in Electronic/Scientific and Analytical Instrumentation, Laser and Light based products, Optics, Electro-optic Testing, Spectroscopy... -
SMARTTECH3D Metrology - 3D Scanners
Send in your samples for a free of charge scan or book an online product demo for the White Light Scanning System. SMARTTECH3D Metrology - 3D scanners are well-known experts in the 3D measurement industry with a wide range of accurate 3D scanners – contactless 3D measurement. Click here to see a video of the new 3D Scanner MICRON3D... -
Measuring Index and Thickness of Silicon Thin Films
The Metricon Model 2010/M provides rapid and accurate measurements of thin films of silicon on cladding layers of lower index materials such as SiO2 or bulk fused silica/glasses for wavelengths at which the films are transparent (typically 1100 nm and above). Convenient 30-second measurements can be made with a single prism for sample thicknesses over the 1.4 -3.5 micron thickness... -
Measuring Refractive Index of Liquids Inside Sealed Containers
Metricon’s Model 2010/M accurately and rapidly measures refractive index of liquids inside sealed containers such as glass vials/bottles, allowing rapid and non-destructive measurement of solution concentration for quality control purposes. Matching liquids are not required between the measuring prism and the wall of the container. If a label is present, the only requirement is that there be a gap of... -
Bringing advanced automation to the forefront using desktop SEM
Over the years, scanning electron microscopes (SEMs) have served as an important tool for quality control. SEMs are used to investigate defects and impurities at the microscopic level, to make accurate adjustments to the production process. Ensuring every product is built to the same high-quality standards. In the past, researchers have been required to perform the same repetitive steps to... -
Lambda Photometrics Ltd are proud to announce our new partner Tabor Electronics
Tabor Electronics (est. 1971) has become a world-leading provider of high-end signal sources, featuring: RF, pulse, function, and arbitrary waveform generators/transceivers, high-voltage amplifiers, as well as waveform and modulation creation software. Tabor has earned global recognition for its highly-skilled workforce and innovative engineering capabilities. The company's extensive product portfolio includes high voltage signal amplifiers, pulse, function and arbitrary waveform generators... -
A History of ZYGO Optical Profilers
Some brief notes on the systems and technology over the years: Heterodyne profiler Maxim 5700: Micro Fizeau, tip/tilt in the head, PSI (Phase Shifting Interferometry), HPUX system controllers. Maxim 3D: PSI, 2 wavelengths for rougher surfaces, HPUX system controllers. NewView 100: The first Scanning White Light Interferometer (SWLI) from Zygo, uses Frequency Domain Analysis (FDA) to achieve high resolution over... -
UK Semiconductors Conference 2021
UK Semiconductors Conference 2021. An annual conference on all aspects of semiconductor research. 7-8th July 2021. The Hallam Hall, Sheffield Hallam University. Click here for more information.